In addition to conventional DLS intensity fluctuations are obtained simultaneously as a function of depth in the sample up to about 3mm. The interferometer part of the technology allows to resolve backscattered light for specific path lengths in the sample simultaneously. Back scattered light interferes with light split from the source with a specific optical path length. Spatially Resolved Dynamic Light Scattering is based on low coherence interferometry of backscattered broadband light (multiple wavelengths instead of a single wavelength laser). In order to overcome the limitations of conventional DLS for process analytical applications InProcess-LSP developed a new innovative technology: Spatially Resolved Dynamic Light Scattering (SR-DLS). Since nanosuspensions are in motion during processing and vary in turbidity levels conventional DLS is unsuitable for process analytical (PAT) applications. Measurements are performed non-invasively in samples as such or directly in the process through any glass interface such as a vial, a flow cell or a specific flask or container type.Ĭonventional DLS measurements need to be performed under static conditions ensuring that particle movements are solely caused by Brownian motion and not influenced by other factors like liquid flow.Īdditionally, conventional DLS cannot be applied to relative turbid suspension without dilution, while these are often encountered in industrial or process environments. In addition, high measurement frequencies of 5 to 10 seconds allow monitoring of relatively fast changing processes as well, and provide a full ‘picture’ of the particle growth process of interest. SR-DLS is capable of measuring nanoparticle size in real time in the submicron region in flowing and undiluted nanosuspensions. Spatially Resolved Dynamic Light Scattering (SR-DLS), a relatively new technology for inline, online and at-line nanoparticle size monitoring, was developed and introduced by InProcess-LSP in 2019.
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